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Avoiding Sample Collisions in your SEM
Manage episode 339741499 series 2948885
内容由Bruker Nano Analytics提供。所有播客内容（包括剧集、图形和播客描述）均由 Bruker Nano Analytics 或其播客平台合作伙伴直接上传和提供。如果您认为有人在未经您许可的情况下使用您的受版权保护的作品，您可以按照此处概述的流程进行操作https://zh.player.fm/legal。
Join us as we speak to Jack Mershon, Applications Specialist for Tescan USA Inc., about SEM advancements and the TESCAN Essence™ 3D Collision Model.
YouTube:
Bruker Detectors https://youtu.be/4iHCLUG7RGw
Website:
Bruker Detectors https://www.bruker.com/en/products-and-solutions/elemental-analyzers/eds-wds-ebsd-SEM-Micro-XRF.html
Essence™ 3D Collision Model – Tescan https://www.tescan.com/product/sem-for-materials-science-tescan-vega/
App Notes application notes:
Essence™ 3D Collision Model – Tescan flyer https://mbna.bruker.com/acton/attachment/15240/f-151ee2e2-f12c-4aa7-9864-7bb93c3f36b8/1/-/-/-/-/Tescan%20-%20Essence%203D%20collision%20model.pdf
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